INTRODUCTION

• 8:00 a.m. -- "MURI 01: Effects of High Power Microwaves and Chaos in 21^st Century Analog and Digital Electronics: Overview of Research Progress", University of Maryland: Victor Granatstein, Steven M. Anlage, Thomas M. Antonsen, Jr., Neil Goldsman, Agis Iliadis, Bruce L. Jacob, John Melngailis, Edward Ott, Omar Ramahi, John Rodgers; Boise State University: R. J. Baker, W. B. Knowlton

A. STATISTICAL PREDICTION OF MICROWAVE COUPLING TO ELECTRONICS INSIDE ENCLOSURES

• 8:20 a.m. -- "Wave Chaos and Coupling to EM Structures", Edward Ott, Thomas Antonsen, Jr., James Hart, Xing Zheng, Sameer Hemmady, Steven M. Anlage, Chris Bertrand, Michael Johnson

• 8:50 a.m. -- "Prediction and Measurement of Induced Voltages Inside Complicated Enclosures Using Wave-Chaos", Sameer Hemmady, Chris Bertrand, Michael Johnson, James Hart, Xing Zheng, Thomas M. Antonsen, Jr., Edward Ott, Steven M. Anlage
  

B. ELECTRONICS VULNERABILITY (UPSET AND DEGRADATION)

• 9:15 a.m. -- "Delayed Feedback and GHz-Scale Chaos on the Driven Diode-Terminated Transmission Line", Steven M. Anlage, Vassili Demergis, Renato de Moraes, Edward Ott, Thomas M. Antonsen, Jr.

• 9:40 a.m. -- "Diffusion Model of Nonlinear HPM Effects in Advanced Electronics", John Rodgers, Todd Firestone, Victor L. Granatstein, Steven M. Anlage, Renato M. De Moraes
  

10:05 a.m. -- COFFEE BREAK

• 10:15 a.m. -- "EM Effects on Semiconductor Devices, Gates and Integrated Circuit Interconnects", Neil Goldsman

• 10:40 a.m. -- "Degradation in Gate Dielectrics and the Effects on Simple Integrated Circuit Building Blocks (SICBBs)", R. G. Southwick III, W. B. Knowlton, R. J. Baker
  

C. MICROWAVE DETECTION AND MITIGATION

• 11:10 a.m. -- "Design, Fabrication, and Testing of On Chip Microwave Pulse Power Detectors", Woochul Jeon, Todd Firestone, John Rodgers, John Melngailis, Robert Newcomb

• 11:35 a.m. -- "System-Level Vulnerability and Mitigation", Bruce Jacob, Hongxia Wang, Samuel Rodriguez, Cagdas Dirik
  

12:00 Noon -- ADJOURN