Workshop on Defects in Wide Band Gap Semiconductors

Tuesday, September 23, 2014

University of Maryland College Park

Wide Band Gap (WBG) semiconductors including Silicon Carbide (SiC) and Gallium Nitride (GaN) have the potential for transformative impact on the 21st century energy economy. However, a high density of crystal defects in WBG materials is significantly hindering the progress in realizing many of the beneficial attributes of WBG-based power electronics systems. For example, there is an overwhelming evidence to suggest that manufacturing yield and cost are critically controlled by material defects. Recent results also suggest that the long-term reliability of WBG-based power electronics systems may be seriously compromised although definitive conclusions cannot be reached. The main objective of this one-day workshop is to bring together nation's leading experts in the WBG supply chain to identify fundamental research needs in WBG materials for advancing power electronics switching applications.

Conference Chairs: 

Aris Christou
University of Maryland

Manijeh Razeghi
Northwestern University

Krishna Shenai
Argonne National Laboratory

See the WBG Workshop web site for program, registration, abstract submission, and more!

Audience: Public  Campus  Clark School  All Students  Graduate  Undergraduate  Faculty  Staff  Post-Docs  Alumni  Corporate 

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