Scientific/Technological Approaches

• Fabricate and test IC's with built-in diagnostic capability.
• Failure analysis of damaged components using focused ion beams (FIB).
• Study of chaotic EM waves and potential to produce upset at relatively low power levels.
• Investigate how upset characteristics depend on RF frequency and modulation.

Team of Investigators

• Multidisciplinary team with expertise in components, circuits, computer architecture, electronic pacakging and EMI, chaos and HPM sources and testing.
• Nonlinear dynamics/chaos group ranked #1 in the US (circuit and wave chaos will be studied).
• Subcontract to Boise State University where Prof. Jake Baker, a recognized CMOS expert, will be the Principal Investigator.