Microwave and Chaos Effects on Electronics
(MURI 2001)
Start Date: May 1, 2001
Presentations for MURI Kickoff Meeting, June 14, 2001
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Microwave Effects and Chaos in 21st Century Analog and Digital Electronics, Victor Granatstein
- Overview of Vulnerabilities in Analog and Digital Electronics, Neil Goldsman
- On-Chip Measurement of Electromagnetic Pulses, R. Jacob Baker
- Microwave Radiation Effects in Digital Data Processors, Bruce Jacob
- Experimental Studies of Interference and Upset In Devices and Gates, Agis Iliadis
- Diagnostics of Upset and Damage Using Focused Ion Beams and Other Advanced Techniques, John Melngailis
- Theory and Modeling of Wave Chaos, Edward Ott, Thomas Antonsen and Steven Anlage
- Chaos Experiments at Microwave Frequencies, Steven Anlage, Edward Ott, and Thomas Antonsen
- Microwave Experimental Design and Methodology, John Rodgers, Yuval Carmel, and Patrick O'Shea
- Computational Electromagnetics and Coupling into Enclosures, Omar Ramahi
Webpage maintained by Dorothea F. Brosius
Created 07/11/01 by DFB
Modified 06/13/02 by DFB