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Graduate Student Seminar - 9/19/2014

"Measuring Surface Potential with Kelvin Probe Force Microscopy"

by Joe Garrett

Friday, September 19, 2014 -- 12:00 p.m.
Large Conference Room, 1207 Energy Research Facility

Advisor:  Assistant Professor Jeremy Munday

Kelvin probe force microscopy (KPFM) has been used to characterize surface electronic properties of metals and semiconductors for over twenty years. I will discuss the motivation for its development and a few methods of implementing the technique.  The different methods predict vastly different patch potential contributions to Casimir force measurements due to differing spatial resolutions.

For additional information about the IREAP Graduate Student Seminars, contact Joe Garrett, David Somers or Joe Murray.

Return to the Graduate Student Seminars schedule.