Adv. Energy Mater. 5, 1501142 (201)https://ireap.umd.edu/10.1002/aenm.2015011422015
Elizabeth M.
Tennyson
Joseph L.
Garrett
Jesse A.
Frantz
Jason D.
Myers
Robel Y.
Bekele
Jasbinder S.
Sanghera
Jeremy N.
Munday
Marina S.
Leite
Journal ArticleAdvanced Materials and NanotechnologyA novel imaging platform to determine the open-circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments.
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