Adv. Energy Mater. 5, 1501142 (201)https://ireap.umd.edu/10.1002/aenm.2015011422015
Elizabeth M. Tennyson Joseph L. Garrett Jesse A. Frantz Jason D. Myers Robel Y. Bekele Jasbinder S. Sanghera Jeremy N. Munday Marina S. Leite
Journal ArticleAdvanced Materials and Nanotechnology

A novel imaging platform to determine the open-circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments.


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